| Course Name |
Materials Characterization
|
|
Code
|
Semester
|
Theory
(hour/week) |
Application/Lab
(hour/week) |
Local Credits
|
ECTS
|
|
ME 480
|
SPRING
|
2
|
2
|
3
|
5
|
| Prerequisites | None | |||||
| Course Language | English | |||||
| Course Type | ELECTIVE_COURSE | |||||
| Course Level | First Cycle | |||||
| Mode of Delivery | Face to face | |||||
| Teaching Methods and Techniques of the Course |
Lecture / Presentation Experiment / Laboratory / Workshop Practice Problem Solving |
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| National Occupational Classification Code | - | |||||
| Course Coordinator |
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| Course Lecturer(s) |
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| Assistant(s) | - | |||||
| Course Objectives | The aim of this course is to introduce modern characterization techniques used to analyze the physical, chemical, mechanical, and thermal properties of engineering materials. The course aims to teach students the fundamental principles of various characterization methods, analysis processes, and interpretation of results. Through this, students will gain proficiency in understanding material properties and selecting the appropriate characterization techniques. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Learning Outcomes |
The students who succeeded in this course;
|
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| Course Description | This course covers the basic characterization techniques used in determining the microstructural, chemical, mechanical and thermal properties of engineering materials. The working principles, application steps and data interpretation processes of analysis techniques such as X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), Fourier Transform Infrared Spectroscopy (FTIR), Raman Spectroscopy and thermal analysis methods (DSC, TGA) will be covered. Students will learn how these analysis methods are used in different materials and will gain the ability to evaluate characterization data. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Related Sustainable Development Goals |
-
|
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Core Courses |
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| Major Area Courses |
X
|
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| Supportive Courses |
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| Media and Managment Skills Courses |
|
|
| Transferable Skill Courses |
|
| Week | Subjects | Required Materials | Learning Outcome |
| 1 | General Principles of Material Analysis Techniques | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 1 | LO1 |
| 2 | Fundamentals of X-ray Diffraction (XRD) Analysis | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 5 | LO2 |
| 3 | General Principles of Scanning Electron Microscopy (SEM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 7 | LO3 |
| 4 | General Principles of Scanning Electron Microscopy (SEM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 7 | LO3 |
| 5 | Fundamentals of Atomic Force Microscopy (AFM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 4 | LO4 |
| 6 | Modes and Application Steps of Atomic Force Microscopy (AFM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 4 | LO4 |
| 7 | General Principles of Transmission Electron Microscopy (TEM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 6 | LO3 |
| 8 | Midterm Exam | - | |
| 9 | General Principles of Transmission Electron Microscopy (TEM) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 6 | LO3 |
| 10 | Fundamentals and Application Steps of FTIR Spectroscopy | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 9 | LO5 |
| 11 | Fundamentals and Application Steps of FTIR Spectroscopy | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 9 | LO6 |
| 12 | Differential Scanning Calorimetry (DSC) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 10 | LO7 |
| 13 | General Principles and Application Steps of Thermogravimetric Analysis (TGA) | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 10 | LO7 |
| 14 | General Principles and Application Steps of Fluorescence Spectroscopy | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008-Chapter 9 | LO8 |
| 15 | Review of the Semester | - | |
| 16 | Final Exam | - |
| Course Notes/Textbooks | Materials Characterization Techniques Sam Zhang Lin Li Ashok Kumar CRC Press 2008 |
| Suggested Readings/Materials | Scanning Microscopy For Nanotechnology: Techniques And Applications Weilie Zhou and Zhong Lin Wang Springer Verlag 2008; Recent Articles Published in Peer-Reviewed Journals |
| Semester Activities | Number | Weighting | LO1 | LO2 | LO3 | LO4 | LO5 | LO6 | LO7 | LO8 |
| Homework / Assignments | 5 | 25 | X | X | X | X | X | |||
| Presentation / Jury | 2 | 10 | X | X | ||||||
| Midterm | 1 | 25 | X | X | X | X | ||||
| Final Exam | 1 | 40 | X | X | X | X | X | X | ||
| Total | 9 | 100 |
| Semester Activities | Number | Duration (Hours) | Workload |
|---|---|---|---|
| Participation | - | - | - |
| Theoretical Course Hours | 16 | 2 | 32 |
| Laboratory / Application Hours | 16 | 2 | 32 |
| Study Hours Out of Class | 16 | 2 | 32 |
| Field Work | - | - | - |
| Quizzes / Studio Critiques | - | - | - |
| Portfolio | - | - | - |
| Homework / Assignments | 5 | 5 | 25 |
| Presentation / Jury | 2 | 5 | 10 |
| Project | - | - | - |
| Seminar / Workshop | - | - | - |
| Oral Exams | - | - | - |
| Midterms | 1 | 9 | 9 |
| Final Exam | 1 | 10 | 10 |
| Total | 150 |
| # | PC Sub | Program Competencies/Outcomes | * Contribution Level | ||||
| 1 | 2 | 3 | 4 | 5 | |||
| No program competency data found. | |||||||
*1 Lowest, 2 Low, 3 Average, 4 High, 5 Highest
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